发明授权
- 专利标题: Chemical vapor deposition process for depositing tungsten
- 专利标题(中): 用于沉积钨的化学气相沉积工艺
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申请号: US857658申请日: 1997-05-16
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公开(公告)号: US06156382A公开(公告)日: 2000-12-05
- 发明人: Ravi Rajagopalan , Steve Ghanayem , Manabu Yamazaki , Keiichi Ohtsuka , Yuji Maeda
- 申请人: Ravi Rajagopalan , Steve Ghanayem , Manabu Yamazaki , Keiichi Ohtsuka , Yuji Maeda
- 申请人地址: CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: CA Santa Clara
- 主分类号: C23C16/08
- IPC分类号: C23C16/08 ; C23C16/02 ; C23C16/14 ; H01L21/28 ; H01L21/285 ; H01L21/768
摘要:
A multiple step chemical vapor deposition process for depositing a tungsten layer on a substrate. A first step of the deposition process includes a nucleation step in which WF.sub.6 and SiH.sub.4 are introduced into a deposition chamber. Next, the flow of WF.sub.6 and SiH.sub.4 are stopped and diborane is introduced into the chamber for between 5-25 seconds. Finally, during a bulk deposition step, the WF.sub.6 is reintroduced into the chamber along with H.sub.2 and B.sub.2 H.sub.6 flows to deposit a tungsten layer on the substrate. In a preferred embodiment, the bulk deposition step also introduces nitrogen into the process gas.
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