Invention Grant
- Patent Title: Method for monitoring the state of microcrystalline change of solid materials
- Patent Title (中): 监测固体材料微晶变化状态的方法
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Application No.: US416306Application Date: 1999-10-12
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Publication No.: US6166551APublication Date: 2000-12-26
- Inventor: Bentley N. Scott , Samuel R. Shortes
- Applicant: Bentley N. Scott , Samuel R. Shortes
- Applicant Address: TX Richardson
- Assignee: Phase Dynamics Inc.
- Current Assignee: Phase Dynamics Inc.
- Current Assignee Address: TX Richardson
- Main IPC: G01N22/00
- IPC: G01N22/00 ; G01N27/26
Abstract:
A process for monitoring the state of microcrystalline change of solid materials, by observing the frequency of a load-pull oscillator which is RF-coupled to the material under test (preferably by a simple single-ended RF probe). Areas where this technique is of particular interest are in monitoring the curing of shaped aerodynamic composite materials, and in monitoring the curing of concrete and cement compositions.
Public/Granted literature
- US5584867A Method and apparatus for controlling a double atrial triple chamber cardiac pacemaker having a fallback mode Public/Granted day:1996-12-17
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