发明授权
- 专利标题: Measuring the thickness of materials
- 专利标题(中): 测量材料的厚度
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申请号: US354216申请日: 1999-07-15
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公开(公告)号: US6166681A公开(公告)日: 2000-12-26
- 发明人: Gregory A. Meszaros , Roger Marquardt , David I. Walker , John G. Estocin , Frank L. Kemeny
- 申请人: Gregory A. Meszaros , Roger Marquardt , David I. Walker , John G. Estocin , Frank L. Kemeny
- 专利权人: USX Corporation
- 当前专利权人: USX Corporation
- 主分类号: G01F23/288
- IPC分类号: G01F23/288 ; C21C5/46 ; C21C7/00 ; G01F23/284 ; G01S7/292 ; G01S13/10 ; G01S13/88
摘要:
Radar is used to measure not only the level of slag on molten steel but also its thickness; the measurement is used to calculate the volume of slag, and, in turn the amount of additives for slag treatment. Time-of-flight data are used to identify peaks representing the distances of the surfaces of the slag and the surface of the underlying steel. The concept is applicable to other materials of differing composition, and particularly where the underlying material is relatively more conductive than the overlying material.
公开/授权文献
- US4423669A Air curtaining apparatus 公开/授权日:1984-01-03
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