发明授权
- 专利标题: Method for producing semiconductor device
- 专利标题(中): 半导体器件的制造方法
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申请号: US09273425申请日: 1999-03-19
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公开(公告)号: US06174757B1公开(公告)日: 2001-01-16
- 发明人: Naoaki Yamaguchi , Hongyong Zhang , Satoshi Teramoto , Hideto Ohnuma
- 申请人: Naoaki Yamaguchi , Hongyong Zhang , Satoshi Teramoto , Hideto Ohnuma
- 优先权: JP6-054865 19940228; JP6-080940 19940327; JP6-092958 19940405; JP6-156514 19940614
- 主分类号: H01L2184
- IPC分类号: H01L2184
摘要:
In producing a semiconductor device such as a thin film transistor (TFT), a silicon semiconductor film is formed on a substrate having an insulating surface, such as a glass substrate, and then a silicon nitride film is formed on the silicon semiconductor film. After that, a hydrogen ion, fluorine ion, or chlorine ion is introduced into the silicon semiconductor film through the silicon nitride film, and then the silicon semiconductor film into which an ion is introduced is heated in an atmosphere containing hydrogen, fluorine, chlorine or these mixture, to neutralize dangling bonds in the silicon semiconductor film and reduce levels in the silicon semiconductor film.
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