发明授权
- 专利标题: Focused particle beam processing for use in electronic apparatus manufacturing
- 专利标题(中): 用于电子设备制造的聚焦粒子束处理
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申请号: US09429060申请日: 1999-10-29
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公开(公告)号: US06180296B2公开(公告)日: 2001-01-30
- 发明人: Michael James Cordes , James Louis Speidell
- 申请人: Michael James Cordes , James Louis Speidell
- 主分类号: G03F900
- IPC分类号: G03F900
摘要:
A lithographically patterned three dimensional stencil type mask is formed on a substrate over a specific area that is to undergo processing. The three dimensional mask functionally provides an energy beam stencil at a precise height over the specific area. The stencil has surface properties that provide a resist function for any scattering of a focused particle beam that passes through an aperture or opening in the center of the stencil, and is formed using standard in the art additive and subtractive processes so that it can be removed after the particle beam processing. It has a particular advantage in an application where it is desired to have sub regions in a pixel area in a liquid crystal display that can provide different domains which operate to provide different pretilt states to the liquid crystal which in turn widens the viewing range of the display.
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