Invention Grant
US06185147B2 Programmable read only memory with high speed differential sensing at low operating voltage
失效
可编程只读存储器,在低工作电压下具有高速差分感测
- Patent Title: Programmable read only memory with high speed differential sensing at low operating voltage
- Patent Title (中): 可编程只读存储器,在低工作电压下具有高速差分感测
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Application No.: US09478243Application Date: 2000-01-04
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Publication No.: US06185147B2Publication Date: 2001-02-06
- Inventor: Kwo-Jen Liu
- Applicant: Kwo-Jen Liu
- Main IPC: G11C800
- IPC: G11C800

Abstract:
A method and apparatus for programmable read only memory with high speed differential sensing at low operating voltage. In one embodiment, a programmable memory cell is comprised of word line, a bitline, and a transistor. The transistor, representing a single binary digit (bit), has a gate coupled to a word line, a drain coupled to a bitline, and a source capable of being programmed to provide a logic level of 0 and a logic level of 1. By programming the source of the transistor, the bitline approximately equal capacitance for both logic level 0 and logic level 1 states.
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