发明授权
- 专利标题: Voltage supply device having self-testing circuit
- 专利标题(中): 具有自检电路的电源装置
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申请号: US09314880申请日: 1999-05-19
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公开(公告)号: US06191967B1公开(公告)日: 2001-02-20
- 发明人: Osamu Katayama , Takahiro Iwamura , Tetsuo Hirano
- 申请人: Osamu Katayama , Takahiro Iwamura , Tetsuo Hirano
- 优先权: JP10-138323 19980520
- 主分类号: H02M7538
- IPC分类号: H02M7538
摘要:
A device selectively supplying a high voltage and a ground level voltage to electrodes of an electroluminescent display panel. The voltage supply device includes a first and a second transistor connected in series, and outputs the high voltage upon turning on the first switching transistor and the ground level voltage upon turning on the second switching transistor. The device includes a circuit for selecting either an operation mode under which the device is normally operated with the high voltage or a test mode under which the device is tested under a low test voltage. The mode selection is performed by an external signal supplied to the device. Under the test mode, the switching transistors are turned on with a low gate voltage by operation of a circuit built in the device. Accordingly, the voltage supply device normally operated under the high voltage is easily tested under the low test voltage.