发明授权
US06232214B1 Method for fabricating inter-metal dielectric layer 有权
制造金属间介电层的方法

  • 专利标题: Method for fabricating inter-metal dielectric layer
  • 专利标题(中): 制造金属间介电层的方法
  • 申请号: US09316475
    申请日: 1999-05-21
  • 公开(公告)号: US06232214B1
    公开(公告)日: 2001-05-15
  • 发明人: Claymens LeeGary Hong
  • 申请人: Claymens LeeGary Hong
  • 优先权: TW88106212 19990419
  • 主分类号: H01L214763
  • IPC分类号: H01L214763
Method for fabricating inter-metal dielectric layer
摘要:
A method for fabricating an inter-metal dielectric layer. Several conducting wires are formed on a substrate, and openings lie between the adjacent conducting wires. A first dielectric layer fills the openings, and the surface of the first dielectric layer is lower than that of the conducting wires. A spacer is formed on a sidewall of each of the conducting wires. The first dielectric layer is removed to expose the bottom of the spacer. A second dielectric layer is formed to cover the conducting wires.
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