发明授权
US06236603B1 High speed charging of core cell drain lines in a memory device 有权
高速充电存储器件中的芯电池漏极线

  • 专利标题: High speed charging of core cell drain lines in a memory device
  • 专利标题(中): 高速充电存储器件中的芯电池漏极线
  • 申请号: US09489232
    申请日: 2000-01-21
  • 公开(公告)号: US06236603B1
    公开(公告)日: 2001-05-22
  • 发明人: Lee Edward Cleveland
  • 申请人: Lee Edward Cleveland
  • 主分类号: G11C700
  • IPC分类号: G11C700
High speed charging of core cell drain lines in a memory device
摘要:
A memory integrated circuit (100) includes an array (102) of core cells (202) addressable by a plurality of word lines (120) and a plurality of drain lines (122). Address circuitry selects one or more word lines and one or more drain lines. Sensing circuit (110) senses a data state of one or more selected core cells of the array of core sells. Drain line charging circuitry charges one or more drain lines prior to sensing this data state. The drain line charging circuitry includes a rapid charging circuit (230) for precharging the one or more drain lines to the predetermined voltage during a precharge period, and a final charging circuit (214) for charging the one or more drain lines to a final charge voltage for sensing the data state.
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