发明授权
- 专利标题: Test and alignment system for electronic display devices
- 专利标题(中): 电子显示设备测试和对准系统
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申请号: US08750522申请日: 1997-03-25
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公开(公告)号: US06252626B1公开(公告)日: 2001-06-26
- 发明人: Eric S. Buckley , Bruce W. C. Lee , Branko Bukal , Wayne G. Dawe , Andrew G. Noonan , Todd R. Richardson
- 申请人: Eric S. Buckley , Bruce W. C. Lee , Branko Bukal , Wayne G. Dawe , Andrew G. Noonan , Todd R. Richardson
- 主分类号: H04N1704
- IPC分类号: H04N1704
摘要:
Apparatus and methods for system and method for testing and aligning a CRT which can sequentially perform all of the tests needed to precisely align the CRT and provide real-time feedback for operator adjustments. The system can integrate each of the measurements and automatically verify measurements previously performed as required. An improved color CCD camera is also provided which can maintain focus irrespective of variations in the thickness and glass curvature of the CRT screen. Further, photodiode optical filter and lens assemblies and wobulator assemblies can be incorporated into the system to further improve the testing and aligning of the CRTs.
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