摘要:
In a method of measuring electron beam profile in an electronic display device, a matrix of video dots is displayed on a display screen of the electronic display device, each of the video dots being comprised of a group of phosphor dots illuminated by an electron beam. An image of a plurality of groups of illuminated phosphor dots forming the video dots within a field of view is then taken. The average horizontal and vertical distances of the video dots within the filed of view is determined and the groups of illuminated phosphor dots forming the video dots in the field of view that are captured in the image are superimposed based on the average horizontal and vertical distances of the video dots generally to average and fill in discontinuities between phosphor dots in the groups and thereby generate an overlay image of the electron beam. Cross-sections of the overlay image can be approximated and at least one intensity profile of the electron beam calculated. Overlay images of each color electron beam can also be captured simultaneously and a convergence error calculated.
摘要:
Apparatus and methods for system and method for testing and aligning a CRT which can sequentially perform all of the tests needed to precisely align the CRT and provide real-time feedback for operator adjustments. The system can integrate each of the measurements and automatically verify measurements previously performed as required. An improved color CCD camera is also provided which can maintain focus irrespective of variations in the thickness and glass curvature of the CRT screen. Further, photodiode optical filter and lens assemblies and wobulator assemblies can be incorporated into the system to further improve the testing and aligning of the CRTs.
摘要:
A test and alignment system for an electronic display device comprises a test pattern generator to be connected to an electronic display device for causing images of video test patterns to be displayed by the electronic display device. A test fixture is positioned in front of the electronic display device to be tested and aligned. The test fixture includes a frame supporting a plurality of close-up optical sensors to sense and produce image signals corresponding to small areas of images displayed on the electronic display device and a plurality of wide-angle optical sensors behind the close-up optical sensors for sensing and producing image signals corresponding to large areas of images displayed on the electronic display device. A computer controls the test pattern generator and processes and analyses the image signals generated by the close-up and wide-angle optical sensors to perform a series of tests on the electronic display device. A display provides a visual indication of the results of the series of tests performed by the computer.
摘要:
A method and apparatus for optically inspecting a display employs sub-pixel accuracy for each primary color to take into account angle of rotation. The method includes capturing images of a display with R×S sensors; determining sets of sensor coordinates mapping to a pixel, determining multiple misalignment angles between the pixel on the display and the R×S sensors, determining multiple x scaling ratios, determining multiple weighting factors associated with R×S sensors in response to the corresponding multiple misalignment angle and the corresponding multiple x and y scaling ratios, determining multiple luminance values for R×S sensors, determining multiple total luminance values in response to the weighting factors and the luminance values, forming scaled images including first and second luminance values, and inspecting the scaled image to identify potential defects of the pixel on the display.