发明授权
US06255886B1 Method for protecting an integrated circuit during burn-in testing 有权
在老化测试期间保护集成电路的方法

  • 专利标题: Method for protecting an integrated circuit during burn-in testing
  • 专利标题(中): 在老化测试期间保护集成电路的方法
  • 申请号: US09560378
    申请日: 2000-04-28
  • 公开(公告)号: US06255886B1
    公开(公告)日: 2001-07-03
  • 发明人: Troy Manning
  • 申请人: Troy Manning
  • 主分类号: H03K508
  • IPC分类号: H03K508
Method for protecting an integrated circuit during burn-in testing
摘要:
A multi-phase charge pump continuously pumps to establish a DC voltage outside the range of supply and reference voltages. The multi-phase charge pump in one embodiment includes four stages operating in a ring with a four-phase clock. Each stage includes a three-mode charge pump that generates and provides reset and control signals to other stages. Each stage includes a pass transistor having a gate driven in excess of the DC voltage for efficient transfer of charge. The gate drive signal from a first stage is coupled to a next stage in the ring where it is used to generate the next gate drive signal. Each gate drive signal corresponds to one waveform having a phase skewed in time so that each stage in the ring is operating in a different mode. In a method of use, a first stepped voltage is developed on a first capacitor and selectively coupled to a second capacitor to develop a second stepped voltage of greater absolute value. The second stepped voltage gates charge transfer from a first stage and enables the selective coupling in a next stage in a sequence of pump stages. The pump stages include protection circuits protecting high-voltage nodes during burn-in testing. The charge pump includes a burn-in detector circuit for detecting burn-in conditions and for turning on the protection circuits and a pump regulator for regulating the output of the charge pump.
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