发明授权
- 专利标题： Measurement method of magnetization direction of magnetoresistive effect devices and measurement apparatus based on the method of TDK corporation
- 专利标题（中）： 基于该方法的磁阻效应器件和测量装置的磁化方向的测量方法
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申请号： US09263778申请日： 1999-03-05
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公开(公告)号： US06294911B1公开(公告)日： 2001-09-25
- 发明人: Koji Shimazawa , Nozomu Hachisuka , Manabu Ohta , Tetsuro Sasaki , Satoru Araki
- 申请人： Koji Shimazawa , Nozomu Hachisuka , Manabu Ohta , Tetsuro Sasaki , Satoru Araki
- 优先权： JP10-078550 19980312
- 主分类号： G01R3309
- IPC分类号： G01R3309
摘要：
A method of measuring magnetization direction of a MR device, includes a first step of obtaining both maximum electrical resistance values under positive and negative applied measurement magnetic fields onto the MR device biased by anti-ferromagnetic material, a second step of relatively rotating a basic axis of the MR device against a direction of the applied measurement magnetic field until both the maximum resistance values become comparatively the same, and a third step of obtaining a relative rotation angle between the basic axis of the MR device and the direction of the applied measurement magnetic field.