发明授权
- 专利标题: CVD process for DCS-based tungsten silicide
- 专利标题(中): 基于DCS的硅化钨的CVD工艺
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申请号: US08764471申请日: 1996-12-12
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公开(公告)号: US06297152B1公开(公告)日: 2001-10-02
- 发明人: Toshio Itoh , Mei Chang
- 申请人: Toshio Itoh , Mei Chang
- 主分类号: H01L2144
- IPC分类号: H01L2144
摘要:
A multiple step chemical vapor deposition process for depositing a tungsten silicide layer on a substrate. A first step of the deposition process includes a pretreatment step in which WF6 is introduced into a deposition chamber. Next, the introduction of WF6 is stopped and a silicon-containing gas, e.g., SiH4, is introduced into the chamber. Finally, during a third step, the SiH4 flow is stopped and DCS and WF6 are introduced into the chamber to deposit a tungsten silicide layer on the substrate.
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