发明授权
- 专利标题: Time-of-flight mass spectrometer and ion analysis
- 专利标题(中): 飞行时间质谱仪和离子分析
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申请号: US09375080申请日: 1999-08-16
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公开(公告)号: US06300626B1公开(公告)日: 2001-10-09
- 发明人: Ansgar Brock , Nestor Rodriguez , Richard N. Zare
- 申请人: Ansgar Brock , Nestor Rodriguez , Richard N. Zare
- 主分类号: H01J4940
- IPC分类号: H01J4940
摘要:
An ion beam supplied from a source is modulated so that ions at a constant flux is passed during on periods or portions thereof and are deflected or stopped during off periods according to a binary sequence in order to encode the ion beam with phase information of the sequence. The binary sequence is such that ions released during two consecutive on periods overlap before reaching a detector, thereby increasing the duty-cycle. The detector output signal is demodulated using the phase information of the binary sequence to recover an ion mass spectrum.
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