The present invention is a memory circuit having a plurality of word lines, a plurality of bit line pairs, and memory cells disposed at the cross-position thereof. The memory comprises: a sense amplifier which is shared by the first bit line pair and the second bit line pair disposed in the column direction and amplifies a voltage of the bit line pairs; a first and a second bit line transfer gates which are disposed between the sense amplifier and the first and second bit line pairs, and connects the bit line pair at the selected memory cell side to the sense amplifier; a bit line clamper, which is disposed between the first and second bit line transfer gates, is shared by the first bit line pair and the second bit line pair, and supplies the precharge level to the bit line pairs; and a bit line short circuit, which is disposed at the first and the second bit line pairs respectively and shorts the bit line pairs. According to the above structure, the reset operation involving a bit line short operation can be executed at high-speed, since the bit line short circuit is disposed for each bit line pair. Also area efficiency can be improved since the bit line clamper circuit is shared by the first and the second bit line pairs.