Invention Grant
- Patent Title: Method for identifying critical to quality dependencies
- Patent Title (中): 识别关键质量依赖关系的方法
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Application No.: US09275985Application Date: 1999-03-25
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Publication No.: US06301516B1Publication Date: 2001-10-09
- Inventor: Michael Charles Ostrowski , Mohamed Ahmed Ali , Philip Paul Beachamp , Bijan Dorri , Arlie Russell Martin , Brian Douglas Lounsberry , Michael Solomon Idelchick
- Applicant: Michael Charles Ostrowski , Mohamed Ahmed Ali , Philip Paul Beachamp , Bijan Dorri , Arlie Russell Martin , Brian Douglas Lounsberry , Michael Solomon Idelchick
- Main IPC: G06F1900
- IPC: G06F1900

Abstract:
A method of generating quality matrices indicating a relationship between critical to quality characteristics and key control parameters for levels of a process. A plurality of rows of a first matrix are designated as critical to quality characteristics and a plurality of columns of the first matrix are designated as key control parameters. Each critical to quality characteristic is assigned a critical to quality weight. An interaction weight is assigned between at least one critical to quality characteristic and at least one key control parameter. A score is then generated for at least one key control parameter in response to said critical to quality weight and said interaction weight.
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