发明授权
- 专利标题: Semiconductor thin film and semiconductor device
- 专利标题(中): 半导体薄膜和半导体器件
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申请号: US09084738申请日: 1998-05-27
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公开(公告)号: US06307214B1公开(公告)日: 2001-10-23
- 发明人: Hisashi Ohtani , Shunpei Yamazaki , Jun Koyama , Yasushi Ogata , Akiharu Miyanaga
- 申请人: Hisashi Ohtani , Shunpei Yamazaki , Jun Koyama , Yasushi Ogata , Akiharu Miyanaga
- 优先权: JP9-165216 19970606; JP10-108550 19980403; JP10-114268 19980409
- 主分类号: H01L2904
- IPC分类号: H01L2904
摘要:
After an amorphous semiconductor thin film is crystallized by utilizing a catalyst element, the catalyst element is removed by performing a heat treatment in an atmosphere containing a halogen element. A resulting crystalline semiconductor thin film has features that it exhibits {110} orientation and that almost all crystal lattices have continuity at a crystal boundary. This type of grain boundaries greatly contribute to improving the carrier mobility, and make it possible to realize semiconductor devices having very high performance.
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