发明授权
- 专利标题: Chemical vapor deposition apparatus and a method of manufacturing a semiconductor device
- 专利标题(中): 化学气相沉积设备和制造半导体器件的方法
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申请号: US09440709申请日: 1999-11-16
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公开(公告)号: US06312526B1公开(公告)日: 2001-11-06
- 发明人: Mikio Yamamuka , Takaaki Kawahara , Masayoshi Tarutani , Tsuyoshi Horikawa , Shigeru Matsuno , Takehiko Sato
- 申请人: Mikio Yamamuka , Takaaki Kawahara , Masayoshi Tarutani , Tsuyoshi Horikawa , Shigeru Matsuno , Takehiko Sato
- 优先权: JP11-156301 19990603
- 主分类号: C23C1604
- IPC分类号: C23C1604
摘要:
In the chemical vapor deposition apparatus, a substrate stage for mounting a substrate is provided inside a reaction chamber of the apparatus. A source gas inlet for introducing a source gas and exhaust outlets and for exhausting the source gas are provided. Exhaust outlet valves provided for exhaust outlets are open and shut successively with time. The direction of the flow of source gas relative to the fixed substrate varies with time. The present chemical vapor deposition apparatus allows the improved evenness of film thickness, the composition ratio, and the like within the substrate surface as well as the reduction of particles of foreign substance generated inside the reaction chamber.
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