Invention Grant
- Patent Title: Single event upset (SEU) hardened latch circuit
- Patent Title (中): 单事件镦粗（SEU）硬化锁存电路
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Application No.: US09844079Application Date: 2001-04-26
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Publication No.: US06327176B1Publication Date: 2001-12-04
- Inventor: Bin Li , David C. Lawson
- Applicant: Bin Li , David C. Lawson
- Main IPC: G11C11412
- IPC: G11C11412
Abstract:
A single event upset hardened latch circuit is disclosed. The single event hardened latch circuit includes a first dual-port inverter and a second dual-port inverter. An input is coupled to the first dual-port inverter via a first set of pass gates. The first dual-port inverter is coupled to the second dual-port inverter via a second set of pass gates. The output is connected to the first and second dual-port inverters.
Information query
