Read/write circuit for accessing chalcogenide non-volatile memory cells

    公开(公告)号:US07099187B2

    公开(公告)日:2006-08-29

    申请号:US11225953

    申请日:2005-09-14

    CPC classification number: G11C13/0004 G11C13/0038 G11C13/004

    Abstract: A read/write circuit for accessing chalcogenide non-volatile memory cells is disclosed. The read/write circuit includes a chalcogenide storage element, a voltage limiting circuit, a current-to-voltage converter, and a buffer circuit. The voltage limiting circuit, which is coupled to the chalcogenide storage element, ensures that voltages across the chalcogenide storage element will not exceed a predetermined value during a read operation. During a read operation, the current-to-voltage converter, which is coupled to the voltage limiting circuit, converts a current pulse read from the chalcogenide storage element to a voltage pulse. By sensing the voltage pulse from the current-to-voltage converter, the buffer circuit can determine a storage state of the chalcogenide storage element.

    Read/write circuit for accessing chalcogenide non-volatile memory cells

    公开(公告)号:US06965521B2

    公开(公告)日:2005-11-15

    申请号:US10631174

    申请日:2003-07-31

    CPC classification number: G11C13/0004 G11C13/0038 G11C13/004

    Abstract: A read/write circuit for accessing chalcogenide non-volatile memory cells is disclosed. The read/write circuit includes a chalcogenide storage element, a voltage limiting circuit, a current-to-voltage converter, and a buffer circuit. The voltage limiting circuit, which is coupled to the chalcogenide storage element, ensures that voltages across the chalcogenide storage element will not exceed a predetermined value during a read operation. During a read operation, the current-to-voltage converter, which is coupled to the voltage limiting circuit, converts a current pulse read from the chalcogenide storage element to a voltage pulse. By sensing the voltage pulse from the current-to-voltage converter, the buffer circuit can determine a storage state of the chalcogenide storage element.

    Self-restoring single event upset (SEU) hardened multiport memory cell
    3.
    发明授权
    Self-restoring single event upset (SEU) hardened multiport memory cell 有权
    自恢复单事件镦粗(SEU)硬化多端口存储单元

    公开(公告)号:US06215694B1

    公开(公告)日:2001-04-10

    申请号:US09553595

    申请日:2000-04-20

    CPC classification number: G11C11/4125

    Abstract: A single event upset hardened multiport memory cell to be utilized in a register file is disclosed. The single event upset hardened multiport memory cell includes a storage cell, a write bitline, a read bitline. The storage cell, which is utilized for storing data, includes first and second sets of cross-coupled transistors and first and second sets of isolation transistors. The first and second sets of isolation transistors are respectively coupled to the first and second set of cross-coupled transistors such that two inversion paths are formed between the two sets of cross-coupled transistors and the two sets of isolation transistors. Coupled to the storage cell, the write bitline inputs write data to the storage cell. Also coupled to the storage cell, the read bitline outputs read data from the storage cell.

    Abstract translation: 公开了一种用于寄存器文件中的单事件硬化多端口存储单元。 单事件硬化多端口存储单元包括存储单元,写位线,读位线。 用于存储数据的存储单元包括第一组和第二组交叉耦合晶体管和第一组和第二组隔离晶体管。 第一和第二组隔离晶体管分别耦合到第一和第二组交叉耦合晶体管,使得在两组交叉耦合晶体管和两组隔离晶体管之间形成两个反转路径。 耦合到存储单元,写位线输入将数据写入存储单元。 读取位线也耦合到存储单元,从存储单元输出读取数据。

    Circuit for accessing a chalcogenide memory array
    4.
    发明授权
    Circuit for accessing a chalcogenide memory array 有权
    用于访问硫属化物存储器阵列的电路

    公开(公告)号:US06944041B1

    公开(公告)日:2005-09-13

    申请号:US10811454

    申请日:2004-03-26

    CPC classification number: G11C13/0004 G11C13/0033 G11C13/004 G11C13/0069

    Abstract: A circuit for accessing a chalcogenide memory array is disclosed. The chalcogenide memory array includes multiple subarrays with rows and columns formed by chalcogenide storage elements. The chalcogenide memory array is accessed by discrete read and write circuits. Associated with a respective one of the subarrays, each of the write circuits includes an independent write 0 circuit and an independent write 1 circuit. Also associated with a respective one of the subarrays, each of the read circuits includes a sense amplifier circuit. In addition, a voltage level control module is coupled to the read and write circuits to ensure that voltages across the chalcogenide storage elements within the chalcogenide memory array do not exceed a predetermined value during read and write operations.

    Abstract translation: 公开了一种用于访问硫族化物存储器阵列的电路。 硫族化物存储器阵列包括具有由硫族化物存储元件形成的行和列的多个子阵列。 硫族化物存储器阵列由离散读和写电路访问。 与相应的一个子阵列相关联,每个写入电路包括独立的写入0电路和独立的写入1电路。 还与相应的一个子阵列相关联,每个读取电路包括读出放大器电路。 此外,电压电平控制模块耦合到读取和写入电路,以确保在读取和写入操作期间跨硫族化物存储器阵列内的硫族化物存储元件的电压不超过预定值。

    Single event upset (SEU) hardened latch circuit
    5.
    发明授权
    Single event upset (SEU) hardened latch circuit 有权
    单事件镦粗(SEU)硬化锁存电路

    公开(公告)号:US06327176B1

    公开(公告)日:2001-12-04

    申请号:US09844079

    申请日:2001-04-26

    CPC classification number: G11C11/4125

    Abstract: A single event upset hardened latch circuit is disclosed. The single event hardened latch circuit includes a first dual-port inverter and a second dual-port inverter. An input is coupled to the first dual-port inverter via a first set of pass gates. The first dual-port inverter is coupled to the second dual-port inverter via a second set of pass gates. The output is connected to the first and second dual-port inverters.

    Abstract translation: 公开了一种单件事件硬化锁定电路。 单事件硬化锁存电路包括第一双端口反相器和第二双端口反相器。 输入端通过第一组通道门耦合到第一双端口逆变器。 第一个双端口逆变器通过第二组通孔连接到第二个双端口逆变器。 输出端连接到第一和第二双端口逆变器。

    Cat litter box
    6.
    外观设计

    公开(公告)号:USD1073216S1

    公开(公告)日:2025-04-29

    申请号:US29881699

    申请日:2023-01-05

    Applicant: Bin Li

    Designer: Bin Li

    Pet feeder
    7.
    外观设计

    公开(公告)号:USD1026346S1

    公开(公告)日:2024-05-07

    申请号:US29863779

    申请日:2022-12-22

    Applicant: Bin Li

    Designer: Bin Li

    Abstract: FIG. 1 is a front, right and top perspective view of a pet feeder, showing my new design;
    FIG. 2 is a rear, left and bottom perspective view thereof;
    FIG. 3 is a front view thereof;
    FIG. 4 is a rear view thereof;
    FIG. 5 is a left side view thereof;
    FIG. 6 is a right side view thereof;
    FIG. 7 is a top plan view thereof; and,
    FIG. 8 is a bottom plan view thereof.

    Multifunctional flexible deformation cup

    公开(公告)号:US20220125226A1

    公开(公告)日:2022-04-28

    申请号:US17083218

    申请日:2020-10-28

    Applicant: Bin Li

    Inventor: Bin Li

    Abstract: This utility model released one kind of multifunctional flexibly transformable cup, comprising one internally cut-through transformable cup and a nested bottom plug that is sealed and clamped with the transformable cup body. The above-mentioned transformable cup is comprised of a foldable enclosure and pin that are successively cut-through and flexibly and tightly connected. The aforesaid seal clamp for embedded bottom plug is located at the junction between the foldable enclosure and pin. When the multifunctional flexibly transformable cup of the utility model is in use, the folding enclosure body can be overturned freely, and the whole body is made of food-grade flexible silica gel material, which is safe and reliable and not easy to be broken. It can also be used as the wine cup, bottle stopper and the bottleneck inserted into the wine bottle that can be directly used for drainage of fluid, with complete functions.

    Skipping evaluation stages during media encoding

    公开(公告)号:US10924743B2

    公开(公告)日:2021-02-16

    申请号:US15549261

    申请日:2015-02-06

    Inventor: Bin Li Jizheng Xu

    Abstract: Various innovations in media encoding are presented herein. In particular, the innovations can reduce the computational complexity of encoding by selectively skipping certain evaluation stages during encoding. For example, based on analysis of decisions made earlier in encoding or based on analysis of media to be encoded, an encoder can selectively skip evaluation of certain coding tools (such as residual coding or rate-distortion-optimized quantization), skip evaluation of certain values for parameters or settings (such as candidate unit sizes or transform sizes, or candidate partition patterns for motion compensation), and/or skip evaluation of certain coding modes (such as frequency transform skip mode) that are not expected to improve rate-distortion performance during encoding.

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