发明授权
- 专利标题: Universal cleaning wafer for a plasma chamber
- 专利标题(中): 用于等离子体室的通用清洁晶片
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申请号: US09156881申请日: 1998-09-18
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公开(公告)号: US06328041B1公开(公告)日: 2001-12-11
- 发明人: Jeffrey J. Brown , Christopher N. Collins , Wilson Tong Lee , George A. Kaplita , Stefan Schmitz , Len Yuan Tsou
- 申请人: Jeffrey J. Brown , Christopher N. Collins , Wilson Tong Lee , George A. Kaplita , Stefan Schmitz , Len Yuan Tsou
- 主分类号: B08B704
- IPC分类号: B08B704
摘要:
A cleaning wafer is used during the vaporization of particulate deposits that were previously deposited on the walls of a plasma chamber. The cleaning wafer includes a first dielectric layer, a conducting layer and a second dielectric layer covering the conducting layer.
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