Invention Grant
- Patent Title: Method of inspecting a substrate furnished with a phosphor layer
- Patent Title (中): 检查配备有荧光体层的基板的方法
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Application No.: US09172434Application Date: 1998-10-14
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Publication No.: US06333500B2Publication Date: 2001-12-25
- Inventor: Frederik C. Gehring , Lambertus J. J. Van Rijsewijk , Pieter Scholten , Petrus J. Uitterhoeve
- Applicant: Frederik C. Gehring , Lambertus J. J. Van Rijsewijk , Pieter Scholten , Petrus J. Uitterhoeve
- Priority: EP97203224 19971015
- Main IPC: G01J502
- IPC: G01J502
Abstract:
A property of a layer of a phosphor screen on a substrate is determined by sending a beam of infrared radiation through the substrate and the layer and measuring, after the passage, the intensity of the beam. The radiation can be measured by a CCD camera.
Public/Granted literature
- US20010045519A1 METHOD OF INSPECTIONG A SUBSTRATE FURNISHED WITH A PHOSPHOR LAYER Public/Granted day:2001-11-29
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