发明授权
- 专利标题: Clean chemistry low-k organic polymer etch
- 专利标题(中): 清洁化学低k有机聚合物蚀刻
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申请号: US09606842申请日: 2000-06-28
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公开(公告)号: US06337277B1公开(公告)日: 2002-01-08
- 发明人: Wen-Ben Chou , Rajinder Dhindsa , Ching-Hwa Chen
- 申请人: Wen-Ben Chou , Rajinder Dhindsa , Ching-Hwa Chen
- 主分类号: H01L21302
- IPC分类号: H01L21302
摘要:
A method of cleanly etching an organic polymer layer disposed over a substrate is disclosed. The invention is particularly useful in damascene processing where openings are etched in the organic polymer layer to form interconnects. The method includes lowering the temperature of the substrate. The method also includes flowing H2O vapor over the organic polymer layer and condensing (or freezing) the H2O vapor on the organic polymer layer. The method additionally includes etching through the organic polymer layer and the condensed H2O vapor to form an opening having a side wall. The condensed (or frozen) H2O vapor is arranged to form a passivating film (of ice) along the side wall of the opening to protect the side wall from etching.
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