发明授权
US06348384B1 Method of using organic polymer as covering layer for device lightly doped drain structure 有权
使用有机聚合物作为器件轻掺杂漏极结构的覆盖层的方法

  • 专利标题: Method of using organic polymer as covering layer for device lightly doped drain structure
  • 专利标题(中): 使用有机聚合物作为器件轻掺杂漏极结构的覆盖层的方法
  • 申请号: US09899141
    申请日: 2001-07-06
  • 公开(公告)号: US06348384B1
    公开(公告)日: 2002-02-19
  • 发明人: Shun Li Lin
  • 申请人: Shun Li Lin
  • 主分类号: H01L21336
  • IPC分类号: H01L21336
Method of using organic polymer as covering layer for device lightly doped drain structure
摘要:
The present invention provides a method of using organic polymer as a covering layer for a device lightly doped drain (LDD) structure, wherein a photo resist is covered by organic polymer, and ion implantation of different energies and kinds are performed to the same region of different line widths, thereby achieving the effect of LDD. Additionally, the covering layer of organic polymer is removed by means of simple and easy oxygen plasma etch so as not to increase the complexity of fabrication process. The complex fabrication process of a device LDD structure in the prior art is thus greatly improved.
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