发明授权
- 专利标题: CMOS sensor with shallow and deep regions
- 专利标题(中): CMOS传感器具有浅和深的区域
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申请号: US09324555申请日: 1999-06-02
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公开(公告)号: US06353240B2公开(公告)日: 2002-03-05
- 发明人: Cheng-Hung Chien , Chih-Hua Lee
- 申请人: Cheng-Hung Chien , Chih-Hua Lee
- 主分类号: H01L27146
- IPC分类号: H01L27146
摘要:
A CMOS sensor. The CMOS sensor comprises a substrate, a gate electrode formed on the substrate, a source/drain region formed in the substrate on one side of the gate electrode, and a sensor region formed in the substrate on another side of the gate electrode. The impurity in the source/drain region is arsenic. The source/drain further comprises a lightly doped drain region. The sensor region comprises a first doped region and a second doped region which together have a dentoid profile. The impurity in the first doped region and the second doped region is phosphorus.
公开/授权文献
- US20010045584A1 CMOS SENSOR WITH SHALLOW AND DEEP REGIONS 公开/授权日:2001-11-29
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