发明授权
- 专利标题: Plasma processing method and apparatus
- 专利标题(中): 等离子体处理方法和装置
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申请号: US09569056申请日: 2000-05-10
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公开(公告)号: US06355573B1公开(公告)日: 2002-03-12
- 发明人: Tomohiro Okumura , Masaki Suzuki , Takuya Matsui
- 申请人: Tomohiro Okumura , Masaki Suzuki , Takuya Matsui
- 优先权: JP11-128185 19990510
- 主分类号: H01L21302
- IPC分类号: H01L21302
摘要:
A plasma processing method that controls an interior of a vacuum chamber to a specified pressure by introducing gas into the vacuum chamber and evacuating the interior of the vacuum chamber. A high-frequency power having a frequency of 50 MHz to 3 GHz is supplied to a site of an antenna other than its center and periphery with the antenna provided opposite to a substrate in the vacuum chamber, in a state where a general center of the antenna and the vacuum chamber are short-circuited to each other. Meanwhile, the interior of the vacuum chamber is controlled to the specified pressure, and plasma is generated within the vacuum chamber and the substrate placed on a substrate electrode is processed within the vacuum chamber.
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