发明授权
- 专利标题: Silicide gate transistors
- 专利标题(中): 硅化物栅极晶体管
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申请号: US09734186申请日: 2000-12-12
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公开(公告)号: US06368950B1公开(公告)日: 2002-04-09
- 发明人: Qi Xiang , Paul R. Besser , Matthew S. Buynoski , John C. Foster , Paul L. King , Eric N. Paton
- 申请人: Qi Xiang , Paul R. Besser , Matthew S. Buynoski , John C. Foster , Paul L. King , Eric N. Paton
- 主分类号: H01L213205
- IPC分类号: H01L213205
摘要:
A method for implementing a self-aligned metal silicide gate is achieved by confining amorphous silicon within a recess overlying a channel and annealing to cause the amorphous silicon with its overlying metal to interact to form the self-aligned metal silicide gate. A gate dielectric layer formed of oxynitride or a nitride/oxide stack is formed on the bottom and sidewalls of the recess prior to depositing the silicon. The silicon is removed except for the portion of the silicon in the recess. The remaining portions of the metal are removed by manipulating the etch selectivity between the metal and the self-aligned metal silicide gate.
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