发明授权
- 专利标题: Probe for testing and repairing printed circuit features
- 专利标题(中): 用于测试和修复印刷电路特性的探头
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申请号: US09317393申请日: 1999-05-24
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公开(公告)号: US06369592B1公开(公告)日: 2002-04-09
- 发明人: Christopher J. Majka , Matthew Seward
- 申请人: Christopher J. Majka , Matthew Seward
- 主分类号: G01R3102
- IPC分类号: G01R3102
摘要:
A handheld probe for testing and monitoring features and pads on circuit boards and other electrical components is provided. The handheld probe includes a probe base having a probe connected to any type of meter, instrument or display and the like. The probe is positioned at an angle away from the probe base and is held in its angled position with respect to the probe base by a probe holder and a probe clamp. Upper and lower cantilever springs are positioned within a hollowed portion of the probe base, and provide a spring return of the probe when a push button is released from its depressed position. A spacer is provided between the upper and lower cantilever springs.
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