公开(公告)号：US06369592B1

公开(公告)日：2002-04-09

申请号：US09317393

申请日：1999-05-24

申请人： Christopher J. Majka ,  Matthew Seward

发明人： Christopher J. Majka ,  Matthew Seward

IPC分类号： G01R3102

CPC分类号： G01R31/2806

摘要： A handheld probe for testing and monitoring features and pads on circuit boards and other electrical components is provided. The handheld probe includes a probe base having a probe connected to any type of meter, instrument or display and the like. The probe is positioned at an angle away from the probe base and is held in its angled position with respect to the probe base by a probe holder and a probe clamp. Upper and lower cantilever springs are positioned within a hollowed portion of the probe base, and provide a spring return of the probe when a push button is released from its depressed position. A spacer is provided between the upper and lower cantilever springs.

摘要翻译： 提供了用于测试和监测电路板和其他电气元件上的功能和焊盘的手持式探头。 手持探头包括具有连接到任何类型的仪表，仪器或显示器等的探针的探针基座。 探针定位成远离探针基座一定角度，并通过探针支架和探针夹持件相对于探针基座保持在其成角度位置。 上下悬臂弹簧定位在探针基座的中空部分内，并且当按钮从其按压位置释放时，提供探针的弹簧返回。 在上下悬臂弹簧之间设有间隔件。

公开(公告)号：US06712261B2

公开(公告)日：2004-03-30

申请号：US10102129

申请日：2002-03-20

申请人： Richard R. Hall ,  How T. Lin ,  Christopher J. Majka ,  Matthew F. Seward ,  Ronald V. Smith

发明人： Richard R. Hall ,  How T. Lin ,  Christopher J. Majka ,  Matthew F. Seward ,  Ronald V. Smith

IPC分类号： B23K3102

CPC分类号： H01L21/486 ,  B23K1/20 ,  H05K3/4046 ,  H05K2201/10234 ,  H05K2201/10287

摘要： An arrangement and method for the insertion the leading end of a length of a metallic element into a through hole which is formed in a substrate, and for heat deforming the inserted leading portion of the metallic element into a predetermined configuration prior to severing therefrom the remaining length of the metallic element.

摘要翻译： 一种用于将金属元件的长度的前端插入到形成在基板中的通孔中并且用于在将金属元件的插入的前导部分从其中切断之前将插入的前导部分变形为预定构造的布置和方法 金属元件的长度。

公开(公告)号：US06651013B1

公开(公告)日：2003-11-18

申请号：US09714372

申请日：2000-11-16

申请人： How T. Lin ,  Christopher J. Majka ,  Matthew Francis Seward

发明人： How T. Lin ,  Christopher J. Majka ,  Matthew Francis Seward

IPC分类号： G01R3100

CPC分类号： G01R31/086

摘要： A method and apparatus for locating a short between two nets in an electrical wire network of a microelectronic structure (e.g., chip, chip carrier, circuit card, etc.). A first net and a second net of the electrical wire are electrically shorted at an unknown point PS on the first net. Points PA and PB on the first net such are selected such that PS is located on a path between PA and PB along the first net. A constant current pulse source is electrically connected between PA and PB and is activated. Voltage drops VAB (from PA to PB) and VAC (from PA to a point PC on the second net) are measured. A length LAS of the path from PA to PS is calculated as a function of VAC/VAB. Computer graphics may be used to graphically display the location of the short within the microelectronic structure.

摘要翻译： 一种用于定位微电子结构（例如，芯片，芯片载体，电路卡等）的电线网络中的两个网之间的短路的方法和装置。 电线的第一网和第二网在第一网上的未知点PS处电短路。 选择第一网上的点PA和PB，使得PS位于沿着第一网的PA和PB之间的路径上。 恒流脉冲源电连接在PA和PB之间并被激活。 测量电压降VAB（从PA到PB）和VAC（从PA到第二网上的点PC）。 作为VAC / VAB的函数计算从PA到PS的路径的长度LAS。 计算机图形可用于在微电子结构内以图形方式显示短路的位置。

公开(公告)号：US4644237A

公开(公告)日：1987-02-17

申请号：US788262

申请日：1985-10-17

申请人： James E. Frushour ,  Michael L. Mahar ,  Christopher J. Majka ,  John E. Swenson

发明人： James E. Frushour ,  Michael L. Mahar ,  Christopher J. Majka ,  John E. Swenson

IPC分类号： B25J9/16 ,  B25J13/00 ,  B25J19/06 ,  G05B19/19 ,  G05B19/4063 ,  G05D1/02

CPC分类号： B25J9/1676 ,  G05B2219/40306 ,  G05B2219/49141 ,  G05B2219/49153 ,  Y10S367/909

摘要： A collision avoidance system for a two arm robot is direction sensitive. When the separation between the arms is sensed as equal to or smaller than a predetermined distance, the trailing arm is slowed to avoid a collision. The separation sensor generates a first "slow" signal when the separation is a first predetermined distance, a second "slow" signal when the separation is a second predetermined distance, smaller than the first, and a "stop" signal when the separation is a third predetermined distance, smaller than the second. The polarity of the drive signals for the arms determine their direction, and polarity sensitive comparators determine the direction of each arm. When the first "slow" signal is present and one arm is moving in the direction of the other arm, a speed reducing resistor is inserted in the circuit for the drive signal for the one arm to reduce its speed. When the second "slow" signal is also present, a second speed reducing resistor is inserted in the drive signal circuit for the one arm, further reducing the velocity. A "stop" signal causes a controller to stop both arms.

摘要翻译： 双臂机器人的防撞系统方向敏感。 当臂之间的距离被感测为等于或小于预定距离时，拖臂减慢以避免碰撞。 当分离是第一预定距离时，分离传感器产生第一“慢”信号，当分离是第二预定距离小于第一预定距离时产生第二“慢”信号，当分离是第一预定距离时产生“停止”信号 第三预定距离，小于第二预定距离。 臂的驱动信号的极性决定其方向，极性敏感的比较器确定每个臂的方向。 当存在第一个“慢”信号并且一个臂沿着另一个臂的方向移动时，减速电阻器被插入到用于一个臂的驱动信号的电路中以降低其速度。 当第二个“慢”信号也存在时，第二减速电阻被插入到一个臂的驱动信号电路中，进一步降低速度。 “停止”信号使控制器停止两臂。

公开(公告)号：US07108809B2

公开(公告)日：2006-09-19

申请号：US10262754

申请日：2002-10-01

申请人： Benson Chan ,  Richard R. Hall ,  How T. Lin ,  Christopher J. Majka ,  John H. Sherman

发明人： Benson Chan ,  Richard R. Hall ,  How T. Lin ,  Christopher J. Majka ,  John H. Sherman

IPC分类号： B29D11/00

CPC分类号： B29D11/00 ,  B29C33/42

摘要： An optical coupler arrangement which is employed for replicating surface features of diverse types of optical devices. Also disclosed is to a novel method of accurately replicating surface features of optical devices; particularly through the utilization of the novel optical coupler arrangement.

摘要翻译： 用于复制各种类型的光学器件的表面特征的光耦合器装置。 还公开了一种准确地复制光学器件的表面特征的新颖方法; 特别是通过利用新颖的光耦合装置。

公开(公告)号：US06982387B2

公开(公告)日：2006-01-03

申请号：US09884778

申请日：2001-06-19

申请人： Richard R. Hall ,  How T. Lin ,  Christopher J. Majka ,  Matthew F. Seward ,  Ronald V. Smith

发明人： Richard R. Hall ,  How T. Lin ,  Christopher J. Majka ,  Matthew F. Seward ,  Ronald V. Smith

IPC分类号： H01R12/04 ,  H05K1/11

CPC分类号： H05K3/4046 ,  H05K3/4614 ,  H05K2201/0382 ,  H05K2201/096 ,  H05K2201/10234 ,  H05K2201/10416

摘要： A method and associated structure for forming a conductive path within a laminate. A conductive element is presses into an opening in the laminate such that portion of at least one end of the conductive element extends beyond a surface of the laminate. A compressive pressure is applied to the portion of the at least one end of the conductive element. The compressive pressure applied to the at least one end of the conductive element forms a contact pad extending beyond the surface of the laminate. The conductive element may include an inner element covered by an outer element.

摘要翻译： 一种用于在层压板内形成导电路径的方法和相关结构。 导电元件被压入层压板中的开口中，使得导电元件的至少一端的一部分延伸超过层压体的表面。 对导电元件的至少一个端部的部分施加压缩压力。 施加到导电元件的至少一个端部的压缩压力形成延伸超过层压体表面的接触垫。 导电元件可以包括被外部元件覆盖的内部元件。

公开(公告)号：US06198529B1

公开(公告)日：2001-03-06

申请号：US09303187

申请日：1999-04-30

申请人： John C. Clark, Jr. ,  Earle W. Gillis ,  Christopher J. Majka ,  Matthew F. Seward ,  Michael M. Westgate

发明人： John C. Clark, Jr. ,  Earle W. Gillis ,  Christopher J. Majka ,  Matthew F. Seward ,  Michael M. Westgate

IPC分类号： G01N2100

CPC分类号： G01N21/95684 ,  G01N2021/8825

摘要： An automated inspection system particularly adapted for detection and discrimination of surface irregularities of specularly reflecting and other materials, such as are employed in laminate chip carriers and printed circuit boards, includes an area scan image sensor allowing illumination sources to surround an area of a surface being inspected. The illumination source preferably provides either or both bright field and dark field illumination of the surface; developing generally complementary images of surface irregularities. A self-registering rules-driven process for developing inspection masks reduces alignment operations and improves performance. Image enhancement and morphological operations to detect surface irregularities are performed by digital signal processing, preferably using a dedicated vision processor. Masks screen potential defects to critical mounting and bonding surfaces accurately without requiring alignment of data or reference images to acquired images. Since potential defects are copied from acquired images and stored, verification of defects may be performed without further access to the inspected part and without removal of the part to another specialized apparatus, simplifying processing and increasing throughput and operator efficiency.

摘要翻译： 特别适用于检测和区分镜面反射和其它材料（例如层压芯片载体和印刷电路板）中使用的表面不规则性的自动检查系统包括允许照明源围绕表面区域的区域扫描图像传感器 检查。 照明源优选地提供表面的亮场和暗场照明之一或两者; 开发表面不规则的一般互补图像。 用于开发检测面罩的自动注册规则驱动过程可减少对齐操作并提高性能。 通过数字信号处理，优选使用专用视觉处理器来执行用于检测表面不规则性的图像增强和形态操作。 将屏幕潜在缺陷屏蔽到关键的安装和粘合表面，无需数据或参考图像对准所获取的图像。 由于潜在的缺陷是从获取的图像中复制并存储的，所以可以在不进一步访问所检查的部分的情况下执行缺陷的验证，并且不将零件移除到另一个专用装置，简化处理并提高吞吐量和操作者效率。

公开(公告)号：US6005394A

公开(公告)日：1999-12-21

申请号：US009367

申请日：1998-01-20

申请人： Christopher J. Majka ,  Matthew F. Seward

发明人： Christopher J. Majka ,  Matthew F. Seward

IPC分类号： G01R31/312 ,  G01R31/02

CPC分类号： G01R31/312

摘要： The accuracy of a capacitive testing procedure is improved by adjusting the ideal values against which comparisons are made during the testing process, for all of the circuit elements (e.g., pin connections) being tested, responsive to cumulative deviations of the measured values from their anticipated ideal values. This can be accomplished by initially comparing all of the capacitance measurements taken for a given printed circuit to their ideal values, and calculating a deviation for each of the comparisons made. Following the testing of an entire printed circuit, the resulting series of calculated deviations are tabulated and averaged, and the resulting average deviation is then added to or subtracted from the tabulated readings for each of the circuit elements before any true defects are identified for the printed circuit being tested. In this way, all of the parts being tested are brought to the same baseline, eliminating overall reference differences (i.e., between different panels).

摘要翻译： 通过调整在测试过程中对于所测试的所有电路元件（例如，引脚连接）进行比较的理想值，来响应于测量值与其预期的累积偏差而改善电容测试程序的精度 理想的价值观。 这可以通过初步比较给定印刷电路所获得的所有电容测量值与其理想值，并计算每个比较的偏差来实现。 在对整个印刷电路进行测试之后，将所得到的一系列计算出的偏差列表和平均值，然后将所得到的平均偏差加到每个电路元件的列表读数中，或者从印制的任何真实缺陷中识别出来 电路被测试。 以这种方式，被测试的所有零件都被带到相同的基准线上，消除了总体参考差异（即在不同的面板之间）。