Invention Grant
- Patent Title: Apparatus and method for characterizing libraries of different materials using X-ray scattering
- Patent Title (中): 使用X射线散射表征不同材料的文库的装置和方法
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Application No.: US09680154Application Date: 2000-10-03
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Publication No.: US06371640B1Publication Date: 2002-04-16
- Inventor: Damian Hajduk , James Bennett , Rakesh Jain
- Applicant: Damian Hajduk , James Bennett , Rakesh Jain
- Main IPC: G01N3100
- IPC: G01N3100

Abstract:
An apparatus for characterizing a library is provided in which the library contains an array of elements and each element contains a different combination of materials. The apparatus includes an x-ray beam directed at the library, a chamber which houses the library and a beamline for directing the x-ray beam onto the library in the chamber. The chamber may include a translation stage that holds the library and that is programmable to change the position of the library relative to the x-ray beam and a controller that controls the movement of the translation stage to expose an element to the x-ray beam in order to rapidly characterize the element in the library. During the characterization, the x-ray beam scatters off of the element and a detector detects the scattered x-ray beam in order to generate characterization data for the element.
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