发明授权
US06372114B1 Method of forming a semiconductor device 失效
形成半导体器件的方法

  • 专利标题: Method of forming a semiconductor device
  • 专利标题(中): 形成半导体器件的方法
  • 申请号: US09288265
    申请日: 1999-04-08
  • 公开(公告)号: US06372114B1
    公开(公告)日: 2002-04-16
  • 发明人: Nobukazu Ito
  • 申请人: Nobukazu Ito
  • 优先权: JP10-096502 19980408
  • 主分类号: C25D502
  • IPC分类号: C25D502
Method of forming a semiconductor device
摘要:
A method of forming a multi-layer structure over an insulating layer comprises the steps of: selectively depositing a barrier layer on a predetermined region of an insulating layer by use of a first deposition mask; selectively depositing a metal seed layer made of a metal which is different in substance from the barrier layer by use of a second deposition mask, so that the metal seed layer extends not only on an entire surface of the barrier layer but also a peripheral region positioned outside the predetermined region of the insulating layer; and forming a metal plating layer made of the metal of the metal seed layer, so that the metal plating layer is adhered on the metal seed layer whereby the metal plating layer is separated from the barrier layer and also from the insulating layer.
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