发明授权
- 专利标题: Fraction defective estimating method and system for estimating an assembly fraction defective of an article
- 专利标题(中): 用于估计制品的组装部分缺陷的分数缺陷估计方法和系统
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申请号: US09566481申请日: 2000-05-08
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公开(公告)号: US06401000B1公开(公告)日: 2002-06-04
- 发明人: Tatsuya Suzuki , Toshijiro Ohashi , Seii Miyakawa , Masaaki Asano , Takashi Kubota
- 申请人: Tatsuya Suzuki , Toshijiro Ohashi , Seii Miyakawa , Masaaki Asano , Takashi Kubota
- 优先权: JP9-079576 19970331
- 主分类号: G06F1900
- IPC分类号: G06F1900
摘要:
A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation, properties/conditions of parts to be assembled and conditions of an assembling shop having significant influence to the likelihood of occurrence of failure in assembling work are inputted as data. Estimated value of assembling-related fraction defective is arithmetically determined with high accuracy by executing an assembling-related fraction defective value estimating program on the basis of the data as inputted.