发明授权
- 专利标题: Method of forming multilevel interconnect structure containing air gaps including utilizing both sacrificial and placeholder material
- 专利标题(中): 形成包含气隙的多层互连结构的方法,包括利用牺牲和占位材料
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申请号: US09652754申请日: 2000-08-31
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公开(公告)号: US06413852B1公开(公告)日: 2002-07-02
- 发明人: Alfred Grill , Jeffrey Curtis Hedrick , Christopher Vincent Jahnes , Satyanarayana Venkata Nitta , Kevin S. Petrarca , Sampath Purushothaman , Katherine Lynn Saenger , Stanley Joseph Whitehair
- 申请人: Alfred Grill , Jeffrey Curtis Hedrick , Christopher Vincent Jahnes , Satyanarayana Venkata Nitta , Kevin S. Petrarca , Sampath Purushothaman , Katherine Lynn Saenger , Stanley Joseph Whitehair
- 主分类号: H01L218234
- IPC分类号: H01L218234
摘要:
A method for forming a multilayer interconnect structure on a substrate that include interconnected conductive wiring and vias spaced apart by a combination of solid or gaseous dielectrics. The inventive method includes the steps of: (a) forming a first planar via plus line level pair embedded in a dielectric matrix formed from one or more solid dielectrics and comprising a via level dielectric and a line level dielectric on a substrate, wherein, at least one of said solid dielectrics is at least partially sacrificial; (b) etching back sacrificial portions of said at least partially sacrificial dielectrics are removed to leave cavities extending into and through said via level, while leaving, at least some of the original via level dielectric as a permanent dielectric under said lines; (c) partially filling or overfilling said cavities with a place-holder material which may or may not be sacrificial; (d) planarizing the structure by removing overfill of said place-holder material; (e) repeating, as necessary, steps (a)-(d); (f) forming a dielectric bridge layer over the planar structure; and (g) forming air gaps by at least partially extracting said place-holder material.
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