发明授权
US06432474B1 Thin film of perovskite type manganese oxide process for producing the same thin film and an infrared sensing element using the same thin film
失效
用于制造相同薄膜的钙钛矿型氧化锰工艺的薄膜和使用相同薄膜的红外线感测元件
- 专利标题: Thin film of perovskite type manganese oxide process for producing the same thin film and an infrared sensing element using the same thin film
- 专利标题(中): 用于制造相同薄膜的钙钛矿型氧化锰工艺的薄膜和使用相同薄膜的红外线感测元件
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申请号: US09342079申请日: 1999-06-28
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公开(公告)号: US06432474B1公开(公告)日: 2002-08-13
- 发明人: Kenji Nakanishi , Hideo Nojima , Yasushi Ogimoto , Yoshihiro Takahashi
- 申请人: Kenji Nakanishi , Hideo Nojima , Yasushi Ogimoto , Yoshihiro Takahashi
- 优先权: JP10-181733 19980629; JP11-169336 19990616
- 主分类号: B05D302
- IPC分类号: B05D302
摘要:
A perovskite type manganese oxide thin film capable of working at temperatures within an electron cooling range and a high sensitivity infrared sensing element using the same thin film are disclosed. The thin film of perovskite type manganese oxide containing an element Ca or Sr and elements La, Mn and O is characterized in that a metal-insulation phase transition point of the thin film lies within a range of temperatures obtainable by a thermoelectric cooling method. The perovskite type manganese oxide is a thin film produced by a sol-gel method and the film is used for manufacturing an infrared sensing element.
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