发明授权
US06432846B1 Silicone polymer insulation film on semiconductor substrate and method for forming the film 有权
半导体衬底上的硅氧烷聚合物绝缘膜及其形成方法

  • 专利标题: Silicone polymer insulation film on semiconductor substrate and method for forming the film
  • 专利标题(中): 半导体衬底上的硅氧烷聚合物绝缘膜及其形成方法
  • 申请号: US09691376
    申请日: 2000-10-18
  • 公开(公告)号: US06432846B1
    公开(公告)日: 2002-08-13
  • 发明人: Nobuo Matsuki
  • 申请人: Nobuo Matsuki
  • 主分类号: B05D306
  • IPC分类号: B05D306
Silicone polymer insulation film on semiconductor substrate and method for forming the film
摘要:
A method for forming a silicone polymer insulation film having low relative dielectric constant, high thermal stability and high humidity-resistance on a semiconductor substrate is applied to a plasma CVD apparatus. The first step is vaporizing a silicon-containing hydrocarbon compound expressed by the general formula Si&agr;O&bgr;CxHy (&agr;=3, &bgr;=3 or 4, x, and y are integers) and then introducing the vaporized compound to the reaction chamber of the plasma CVD apparatus. The next step is introducing additive gas into the reaction chamber. The residence time of the material gas is lengthened by reducing the total flow of the reaction gas, in such a way as to formed a silicone polymer film having a micropore porous structure with low relative dielectric constant.
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