A semiconductor device testing system is provided which can efficiently utilize a plurality of semiconductor device testing apparatus. There are provided a host computer 2 for controlling a plurality of semiconductor device testing apparatus 1A, 1B, and 1C, and a dedicated classifying machine 3. Storage information memory means 4 for storing storage information of each semiconductor device such as a number assigned to each tested semiconductor device, the test results of each semiconductor device, and the like is provided in the host computer 2. Without sorting the tested devices or with the sorting operation of the tested devices into only two categories in the handler part 11 of each testing apparatus, the tested devices are transferred from the test tray to a general-purpose tray, and during this transfer operation, the storage information of each device is stored in the storage information memory means. When all the tests are completed, the storage information of each device stored in the storage information memory means is transmitted to the dedicated classifying machine by which the tested devices are sorted out.