公开(公告)号：US06433294B1

公开(公告)日：2002-08-13

申请号：US09505634

申请日：2000-02-16

申请人： Shin Nemoto ,  Yoshihito Kobayashi ,  Hiroo Nakamura ,  Takeshi Onishi ,  Hiroki Ikeda

发明人： Shin Nemoto ,  Yoshihito Kobayashi ,  Hiroo Nakamura ,  Takeshi Onishi ,  Hiroki Ikeda

IPC分类号： B07C5344

CPC分类号： G01R31/31907 ,  G01R31/2834 ,  G01R31/2887 ,  G01R31/31912

摘要： A semiconductor device testing system is provided which can efficiently utilize a plurality of semiconductor device testing apparatus. There are provided a host computer 2 for controlling a plurality of semiconductor device testing apparatus 1A, 1B, and 1C, and a dedicated classifying machine 3. Storage information memory means 4 for storing storage information of each semiconductor device such as a number assigned to each tested semiconductor device, the test results of each semiconductor device, and the like is provided in the host computer 2. Without sorting the tested devices or with the sorting operation of the tested devices into only two categories in the handler part 11 of each testing apparatus, the tested devices are transferred from the test tray to a general-purpose tray, and during this transfer operation, the storage information of each device is stored in the storage information memory means. When all the tests are completed, the storage information of each device stored in the storage information memory means is transmitted to the dedicated classifying machine by which the tested devices are sorted out.

摘要翻译： 提供一种可有效利用多个半导体器件测试装置的半导体器件测试系统。 设置有用于控制多个半导体器件测试装置1A，1B和1C的主计算机2和专用分类机3.存储信息存储装置4，用于存储每个半导体装置的存储信息，例如分配给每个半导体装置的号码 测试半导体器件，每个半导体器件的测试结果等被提供在主计算机2中。在每个测试装置的处理器部分11中，不对所测试的器件进行分类或将被测试器件的分类操作分为仅两个类别 被测试的设备从测试托盘传送到通用托盘，并且在该传送操作期间，每个设备的存储信息被存储在存储信息存储器装置中。 当所有测试完成时，存储在存储信息存储器装置中的每个设备的存储信息被发送到专门的分类机，通过该分类机对被测试的设备进行整理。

公开(公告)号：US6066822A

公开(公告)日：2000-05-23

申请号：US809702

申请日：1997-03-27

申请人： Shin Nemoto ,  Yoshihito Kobayashi ,  Hiroo Nakamura ,  Takeshi Onishi ,  Hiroki Ikeda

发明人： Shin Nemoto ,  Yoshihito Kobayashi ,  Hiroo Nakamura ,  Takeshi Onishi ,  Hiroki Ikeda

IPC分类号： G01R31/26 ,  G01R31/28 ,  G01R31/319 ,  B07C5/344

CPC分类号： G01R31/31907 ,  G01R31/2834 ,  G01R31/2887 ,  G01R31/31912

摘要： A semiconductor device testing system is provided efficiently utilizes a plurality of semiconductor device testing apparatus. More particularly, a host computer controls a plurality of semiconductor device testing apparatuses and a dedicated classifying machine. A storage information memory stores storage information of each semiconductor device such as a number assigned to each tested semiconductor device such as a number assigned to each tested semiconductor device, the test results of each semiconductor device, and is provided in the host computer. Without sorting the tested devices or with the sorting operation of the tested devices into only two categories in a handler part of each testing apparatus, the tested devices are transferred from the test tray to a general-purpose tray, and during this transfer operation, the storage information of each device is stored in the storage information memory. When all of the tests are completed, the storage information of each device stored in the storage information memory is transmitted to the dedicated classifying machine by which the tested devices are sorted out.

摘要翻译： PCT No.PCT / JP96 / 02130 Sec。 371日期：1997年5月27日 102（e）日期1997年5月27日PCT提交1996年7月29日PCT公布。 出版物WO97 / 05496 日期1997年2月13日提供半导体器件测试系统有效地利用多个半导体器件测试装置。 更具体地，主计算机控制多个半导体器件测试装置和专用分选机。 存储信息存储器存储每个半导体器件的存储信息，例如分配给每个测试的半导体器件的数量，例如分配给每个测试的半导体器件的数量，每个半导体器件的测试结果，并且设置在主计算机中。 在每个测试设备的处理器部分中，如果不对被测试的设备进行分类或将被测试设备的分类操作分成两类，则测试设备从测试托盘传送到通用托盘，并且在该传送操作期间， 每个设备的存储信息被存储在存储信息存储器中。 当所有测试完成时，存储在存储信息存储器中的每个设备的存储信息被发送到专用分类机，通过该专用分类机对被测试的设备进行整理。

公开(公告)号：US08653433B2

公开(公告)日：2014-02-18

申请号：US13145047

申请日：2010-01-13

申请人： Daisuke Mashimo ,  Hiroki Ikeda ,  Yoshinobu Morita

发明人： Daisuke Mashimo ,  Hiroki Ikeda ,  Yoshinobu Morita

IPC分类号： H03G3/20

CPC分类号： H03F3/087 ,  H03F1/083 ,  H03G3/3084 ,  H04B10/272 ,  H04B10/6931

摘要： In a gain-switching-type transimpedance amplifier, in order to provide a technique capable of preventing unnecessary gain switching caused when noise is received, and preventing decrease in sensitivity caused when noise with a large input level is received, and then, a burst signal with a small input level is received, a transimpedance amplifier 5 includes: a pre-amplifier 200 to which the burst signal is inputted; an average detection start determination unit 300 for comparing an output of a pre-amplifier 200 with a first threshold voltage; an average detection circuit 400 for detecting and outputting an average value of the output of the pre-amplifier 200 during a certain period of time from a time point when the output of the pre-amplifier 200 exceeds the first threshold voltage; and a gain switching control unit 500 for determining whether to switch a gain of the pre-amplifier 200 based on an output of the average detection circuit 400.

摘要翻译： 在增益切换式跨阻放大器中，为了提供能够防止在接收到噪声时引起的不必要的增益切换的技术，并且防止在接收到具有大输入电平的噪声时引起的灵敏度降低，然后，突发信号 在接收到小的输入电平的情况下，跨阻抗放大器5包括：输入突发信号的前置放大器200; 平均检测开始判定单元300，用于将前置放大器200的输出与第一阈值电压进行比较; 平均检测电路400，用于在从前置放大器200的输出超过第一阈值电压的时间点起，在一定时间段内检测并输出前置放大器200的输出的平均值; 以及用于基于平均检测电路400的输出来确定是否切换前置放大器200的增益的增益切换控制单元500。

公开(公告)号：US08422762B2

公开(公告)日：2013-04-16

申请号：US12738780

申请日：2007-10-31

申请人： Masayoshi Ichikawa ,  Hiroki Ikeda

发明人： Masayoshi Ichikawa ,  Hiroki Ikeda

IPC分类号： G06K9/00

CPC分类号： G01R31/2887 ,  G01R31/2874 ,  G06T7/0004

摘要： An abnormality detecting apparatus includes an imaging device for obtaining image data of a TIM, a failure detecting section for detecting appearance failures of the TIM on the basis of the image data of the TIM obtained by the imaging device, and a determining device for determining whether an abnormality occurs at the TIM on the basis of a detection result by the failure detecting section.

摘要翻译： 异常检测装置包括用于获取TIM的图像数据的成像装置，用于根据由成像装置获得的TIM的图像数据检测TIM的出现故障的故障检测部分，以及用于确定是否 基于故障检测部的检测结果，TIM发生异常。

公开(公告)号：US08380065B2

公开(公告)日：2013-02-19

申请号：US12582083

申请日：2009-10-20

申请人： Michitaka Okuno ,  Koji Wakayama ,  Kenichi Sakamoto ,  Hiroki Ikeda

发明人： Michitaka Okuno ,  Koji Wakayama ,  Kenichi Sakamoto ,  Hiroki Ikeda

IPC分类号： H04J14/00

CPC分类号： H04Q11/0067 ,  H04J2203/0058 ,  H04L43/0864 ,  H04Q2011/0079 ,  H04Q2011/0088

摘要： Provided is an optical access system comprising: an optical line terminal connected to another network; a plurality of optical network units, each connected to a user terminal; and at least one of an optical switching unit and an optical splitter, which is installed between the optical line terminal and the plurality of optical network units. The optical line terminal allocates a length of time to a discovery phase for detecting the plurality of optical network units, and a length of time to data transmission phases for transferring data from the plurality of optical network units; and changes a ratio of the length of time of the discovery phase to the length of time of the data transmission phases so that the length of time of the discovery phase is shortened in the case where a number of the optical network units that are registered in the optical line terminal increase.

摘要翻译： 提供一种光接入系统，包括：连接到另一网络的光线路终端; 多个光网络单元，各自连接到用户终端; 以及安装在光线路终端与多个光网络单元之间的光交换单元和分光器中的至少一个。 光线路终端将用于检测多个光网络单元的发现阶段的时间长度分配给从多个光网络单元传送数据的数据传输阶段的时间长度; 并且将发现阶段的时间长度与数据传输阶段的时间长度的比率进行改变，使得在注册的光网络单元的数量的情况下，发现阶段的时间长度被缩短 光线路终端增加。

公开(公告)号：US20130004172A1

公开(公告)日：2013-01-03

申请号：US13535405

申请日：2012-06-28

申请人： Jun SUGAWA ,  Daisuke Mashimo ,  Hiroki Ikeda

发明人： Jun SUGAWA ,  Daisuke Mashimo ,  Hiroki Ikeda

IPC分类号： H04J14/02

CPC分类号： H04J3/1694 ,  H04B10/272 ,  H04J14/0221 ,  H04J14/0246 ,  H04J14/025 ,  H04J14/0267

摘要： Technology to provide linked control of bandwidth allocation to a plurality of optical network units among the plural wavelengths by a bandwidth allocation section coupled to the plural optical network units.

摘要翻译： 通过耦合到多个光网络单元的带宽分配部分，向多个波长中的多个光网络单元提供带宽分配的链接控制的技术。

公开(公告)号：US08281978B2

公开(公告)日：2012-10-09

申请号：US12744540

申请日：2007-12-20

申请人： Hiroki Ikeda ,  Katsu Yanagimoto

发明人： Hiroki Ikeda ,  Katsu Yanagimoto

IPC分类号： B23K31/02

CPC分类号： H05K3/3463 ,  B23K35/02 ,  B23K35/262 ,  C21D9/50 ,  C22C12/00 ,  C22C13/00 ,  C22C28/00 ,  C22C30/00 ,  H01L24/13 ,  H01L24/16 ,  H01L24/81 ,  H01L25/0655 ,  H01L25/105 ,  H01L2224/13099 ,  H01L2224/131 ,  H01L2225/1023 ,  H01L2225/1058 ,  H01L2924/00011 ,  H01L2924/00014 ,  H01L2924/01004 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01025 ,  H01L2924/01027 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01049 ,  H01L2924/01063 ,  H01L2924/01075 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/01322 ,  H01L2924/01327 ,  H01L2924/14 ,  H05K3/3436 ,  H05K2203/1121 ,  H05K2203/1476 ,  Y02P10/212 ,  Y10T428/31678 ,  H01L2924/014 ,  H01L2224/81805 ,  H01L2224/0401

摘要： Disclosed herein is an electronic apparatus produced using a high-temperature lead-free solder alloy which makes it possible to form soldered joints having no variations in strength and which has an excellent balance between strength and solderability. The lead-free solder alloy is an alloy which is made of an element A and an element B and which has a composition composed of AmBn being a stable phase and the element B in an equilibrium state at room temperature. When the lead-free solder alloy is solidified by quenching, the element A is dissolved in a room-temperature stable phase of the element B so that a supersaturated solid solution is formed, and when melted for soldering and then solidified, the alloy returns to its equilibrium state and has a composition composed of the stable phase AmBn and the element B and therefore maintains strength due to the presence of the stable phase AmBn even when reheated to a soldering temperature.

摘要翻译： 本文公开了使用高温无铅焊料合金制造的电子设备，其使得可以形成没有强度变化的焊接接头，并且在强度和可焊性之间具有优异的平衡。 无铅焊料合金是由元素A和元素B制成的合金，其组成由AmBn构成稳定相，元素B在室温下处于平衡状态。 当无铅焊料合金通过淬火固化时，元件A溶解在元件B的室温稳定相中，从而形成过饱和固溶体，当熔化熔化然后固化时，合金回到 其平衡状态并且具有由稳定相AmBn和元素B组成的组成，因此即使在再加热到焊接温度时也由于存在稳定相AmBn而保持强度。

公开(公告)号：US08239468B2

公开(公告)日：2012-08-07

申请号：US12581401

申请日：2009-10-19

申请人： Hiroki Ikeda ,  Shiro Tanabe ,  Kazuma Yumoto ,  Masashi Yano

发明人： Hiroki Ikeda ,  Shiro Tanabe ,  Kazuma Yumoto ,  Masashi Yano

IPC分类号： G06F15/16

CPC分类号： H04L47/20 ,  H04L41/5035 ,  H04L41/5067 ,  H04L47/2408 ,  H04L47/2416 ,  H04L67/306 ,  H04L69/03

摘要： A session QoS control arrangement wherein for an occurrence of user session information indicating a change of user state and/or a change of session condition from a user communication terminal: said session information analysis means analyses the session state of the user terminal in real-time by referring to said session management database and said user preference database; and, said session QoS control means determines the QoS policy for the user session in real-time, based on the result of session analysis performed by said session information analysis means.

摘要翻译： 一种会话QoS控制装置，其中，用于从用户通信终端发出指示用户状态的改变和/或会话状态的改变的用户会话信息的发生：所述会话信息分析装置实时地分析用户终端的会话状态 通过参考所述会话管理数据库和所述用户偏好数据库; 并且所述会话QoS控制装置基于所述会话信息分析装置执行的会话分析的结果，实时地确定用户会话的QoS策略。

公开(公告)号：US08116627B2

公开(公告)日：2012-02-14

申请号：US12222224

申请日：2008-08-05

申请人： Hiroki Ikeda ,  Toshiki Sugawara ,  Yusuke Yajima

发明人： Hiroki Ikeda ,  Toshiki Sugawara ,  Yusuke Yajima

IPC分类号： H04B10/20

CPC分类号： H04B10/272 ,  H04B10/27

摘要： When a signal of weak optical power is received immediately after a signal of intense optical power, input of the signal of intense optical power readily causes saturation, and the influence interferes in the signal of weak optical power to deteriorate receiver sensitivity. Moreover, when a reverse-bias voltage of APD is changed, if a difference between the voltages is large, a next optical signal is received until the receiver sensitivity of the APD becomes stable, so that receiver sensitivity deteriorates. A DBA order is determined so that a difference in reverse-bias voltage is small, and reverse-bias voltage is controlled in line with reception timing from ONU.

摘要翻译： 当在强光信号之后立即接收到弱光功率的信号时，强光信号信号的输入容易引起饱和，并且影响会干扰弱光功率的信号，从而降低接收机灵敏度。 此外，当APD的反向偏置电压发生变化时，如果电压差大，则接收下一个光信号，直到APD的接收灵敏度变得稳定为止，接收灵敏度变差。 确定DBA顺序，使得反向偏置电压的差小，并且根据ONU的接收定时来控制反向偏置电压。

公开(公告)号：US07936991B2

公开(公告)日：2011-05-03

申请号：US12068829

申请日：2008-02-12

申请人： Toshiki Sugawara ,  Masahiko Mizutani ,  Hiroki Ikeda ,  Kenichi Sakamoto

发明人： Toshiki Sugawara ,  Masahiko Mizutani ,  Hiroki Ikeda ,  Kenichi Sakamoto

IPC分类号： H04B10/20 ,  H04J14/00

CPC分类号： H04L7/0075 ,  H04J3/1694

摘要： An optical access communication apparatus and an optical access communication system for the coexistence of two wideband PON systems without using an expensive optical device or module. A low-speed PON and a high-speed PON have a same upstream wavelength, and an OLT receives optical signals by a same optical receiver in the two systems, converts the optical signals into electric signals, amplifies the electric signals, branches the amplified electric signals, and processes the branched signals by clock and data recovery sections of bit rates corresponding to the two PON systems, thereby achieving an optical communication apparatus and an optical communication system for constructing a simple and low-cost triple-play service system of excellent transmission quality.

摘要翻译： 一种用于两个宽带PON系统共存而不使用昂贵的光学设备或模块的光接入通信设备和光接入通信系统。 低速PON和高速PON具有相同的上行波长，并且OLT在两个系统中通过相同的光接收器接收光信号，将光信号转换为电信号，放大电信号，将放大的电 信号，并通过对应于两个PON系统的比特率的时钟和数据恢复部分对分支信号进行处理，从而实现用于构建出色传输的简单且低成本的三重播放业务系统的光通信装置和光通信系统 质量。