发明授权
US06445238B1 Method and apparatus for adjusting delay in a delay locked loop for temperature variations 有权
用于调整温度变化的延迟锁定环路延迟的方法和装置

  • 专利标题: Method and apparatus for adjusting delay in a delay locked loop for temperature variations
  • 专利标题(中): 用于调整温度变化的延迟锁定环路延迟的方法和装置
  • 申请号: US09452234
    申请日: 1999-12-01
  • 公开(公告)号: US06445238B1
    公开(公告)日: 2002-09-03
  • 发明人: Austin H. Lesea
  • 申请人: Austin H. Lesea
  • 主分类号: H03H1126
  • IPC分类号: H03H1126
Method and apparatus for adjusting delay in a delay locked loop for temperature variations
摘要:
The supply voltage to which a delay circuit's buffer stages are coupled is adjusted in response to changes in temperature according to a predetermined relationship to maintain a substantially constant buffer stage gate delay over temperature variations. Decreasing gate delays resulting from decreases in temperature are offset by decreasing the supply voltage, which in turn increases gate delays. Conversely, increasing gate delays resulting from increases in temperature are offset by increasing the supply voltage, which in turn decreases gate delays. In some embodiments, a control circuit is connected to the reference voltage circuit that supplies VCC to the delay circuit, and adjusts VCC in response to temperature to maintain substantially constant gate delay over temperature. In one embodiment, the control circuit includes a microprocessor and a look-up table containing desired supply voltage versus temperature mappings. In another embodiment, the control circuit is formed as part of an existing bandgap reference circuit associated with the reference voltage circuit, and therefore consumes minimal silicon area.
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