发明授权
- 专利标题： Apparatus for measurement of critical current in superconductive tapes
- 专利标题（中）： 超导磁带中临界电流测量装置
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申请号： US09615640申请日： 2000-07-13
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公开(公告)号： US06452375B1公开(公告)日： 2002-09-17
- 发明人: J. Yates Coulter , Raymond DePaula
- 申请人： J. Yates Coulter , Raymond DePaula
- 主分类号： G01R1900
- IPC分类号： G01R1900
摘要：
A cryogenic linear positioner which is primarily used for characterizing coated conductor critical current homogeneity at 75K is disclosed. Additionally, this tool can be used to measure the positional dependence of the coated conductor resistance at room temperature, and the room temperature resistance of the underlying YBCB coating without the overlaying protective cover of silver.
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