发明授权
- 专利标题: X-ray generator, X-ray inspector and X-ray generation method
- 专利标题(中): X射线发生器,X光检查仪和X射线产生方法
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申请号: US09739834申请日: 2000-12-20
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公开(公告)号: US06456690B2公开(公告)日: 2002-09-24
- 发明人: Koichi Yamada , Takeshige Tanigaki
- 申请人: Koichi Yamada , Takeshige Tanigaki
- 优先权: JP2000-171440 20000608
- 主分类号: G21G400
- IPC分类号: G21G400
摘要:
An X-ray generator, an X-ray inspector and an X-ray generation method capable of automatically focusing an energy beam, such as an electron beam for generating an X-ray, on a target are provided. The generation, inspector and the method have been developed by turning an attention on the fact that convergence conditions of an electron beam has a close relationship with a temperature on a surface of an X-ray tube target. The method comprises the steps of measuring the temperature changes at real time by a temperature sensor 14 and automatically controlling a current value of a focusing coil 6.
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