A method and apparatus for correcting electronic offset and gain variations in solid state x-ray detectors includes dedicating rows at the end of an x-ray detector scan. The dedicated rows may be used to measure the “signal” induced by electronic offset and gain variations in solid state x-ray detectors. The first row may be used to measure the signal induced by electronic offset. The second row may be used to measure to signal induced by gain variations. Measurements of the induced signals taken from the dedicated rows may be used to eliminate structured artifacts from the x-ray image.