发明授权
US06458649B1 Methods of forming capacitor-over-bit line memory cells 有权
形成电容器对位线存储单元的方法

Methods of forming capacitor-over-bit line memory cells
摘要:
Methods of forming capacitor-over-bit line memory cells are described. In one embodiment, a bit line contact opening is etched through conductive bit line material. In one implementation, a bit line contact opening is etched through a previously-formed bit line. In one implementation, a bit line contact opening is etched after forming a bit line.
信息查询
0/0