发明授权
- 专利标题: Manufacturing method and integrated microstructures of semiconductor material and integrated piezoresistive pressure sensor having a diaphragm of polycrystalline semiconductor material
- 专利标题(中): 半导体材料的制造方法和集成微结构以及具有多晶半导体材料的隔膜的集成压阻式压力传感器
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申请号: US09723357申请日: 2000-11-27
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公开(公告)号: US06472244B1公开(公告)日: 2002-10-29
- 发明人: Paolo Ferrari , Benedetto Vigna , Flavio Villa
- 申请人: Paolo Ferrari , Benedetto Vigna , Flavio Villa
- 优先权: EP96830437 19960731; EP97830339 19970707
- 主分类号: H01L2100
- IPC分类号: H01L2100
摘要:
The method inlcudes the steps of forming a sacrificial buried region of insulating material on a substrate of monocrystalline semiconductor material, epitaxially growing a first semiconductor material layer on the substrate, the first semiconductor material layer including a polycrystalline region over the sacrificial buried region and a monocrystalline region elsewhere, the substrate and the semiconductor material layer surrounding the sacrificial buried region on all sides, and removing the sacrificial buried region. The portion of the polycrystalline region surrounded by the trench thus forms a suspended structure separated and isolated thermally from the rest of the semiconductor material layer. Using microelectronics processes, electronic components are formed in the monocrystalline region, and dedicated regions are formed at the suspended structure, so that the electronic components are integrated in the same chip with static, kinematic or dynamic microstructures.
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