• Patent Title: Measuring method of liquid crystal pretilt angle and measuring equipment of liquid crystal pretilt angle
  • Application No.: US09940524
    Application Date: 2001-08-29
  • Publication No.: US06473180B2
    Publication Date: 2002-10-29
  • Inventor: Ichiro Hirosawa
  • Applicant: Ichiro Hirosawa
  • Priority: JP9-331715 19971202
  • Main IPC: G01J400
  • IPC: G01J400
Measuring method of liquid crystal pretilt angle and measuring equipment of liquid crystal pretilt angle
Abstract:
By setting the linearly polarized light with normal incidence on the liquid crystal sample 3 and rotating the liquid crystal sample 3 on a rotation stage 7 within plane, the dependencies of the amplitude ratio as well as the optical retardation of the transmitted light on the azimuth of the liquid crystal sample, with respect to the polarization direction of the incident light, are measured. From these measured results, a liquid crystal pretilt angle is determined.
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