发明授权
US06476635B1 Programmable number of metal lines and effective metal width along critical paths in a programmable logic device
有权
可编程逻辑器件中的可编程数量的金属线和沿着关键路径的有效金属宽度
- 专利标题： Programmable number of metal lines and effective metal width along critical paths in a programmable logic device
- 专利标题（中）： 可编程逻辑器件中的可编程数量的金属线和沿着关键路径的有效金属宽度
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申请号： US09604992申请日： 2000-06-28
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公开(公告)号： US06476635B1公开(公告)日： 2002-11-05
- 发明人: Irfan Rahim , John E. Berg
- 申请人： Irfan Rahim , John E. Berg
- 主分类号： H03K19177
- IPC分类号： H03K19177
摘要：
A layout architecture for a programmable logic device comprising one or more adjacent metal lines, a first circuit, and a second circuit. The one or more adjacent metal lines may each comprise a critical path. The first circuit may be configured to present an input signal to each of the one or more adjacent metal lines in response to a configuration signal. The second circuit may be configured to (i) receive a signal from at least one of the one or more adjacent metal lines selected in response to the configuration signal and (ii) generate an output signal in response to the received signal.