Invention Grant
- Patent Title: Through wafer backside contact to improve SOI heat dissipation
- Patent Title (中): 通过晶片背面接触改善SOI散热
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Application No.: US09427135Application Date: 1999-10-25
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Publication No.: US06483147B1Publication Date: 2002-11-19
- Inventor: Ming-Ren Lin
- Applicant: Ming-Ren Lin
- Main IPC: H01L2701
- IPC: H01L2701

Abstract:
In one embodiment, the present invention relates to a method of facilitating heat removal from a device layer of a silicon-on-insulator substrate comprising bulk silicon, an insulation layer over the bulk silicon, and a silicon device layer over the insulation layer involving forming at least one conductive plug comprising a conductive material within the bulk silicon and the insulation layer so as to contact the silicon device layer. In another embodiment, the present invention relates to a silicon-on-insulator structure, made of a silicon substrate layer; an insulation layer over the silicon substrate layer; a silicon device layer comprising silicon over the insulation layer; a conductive plug through the silicon substrate layer and the insulation layer contacting the silicon device layer; and a heat generating structure on the silicon device layer at least partially overlapping the conductive plug.
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