Invention Grant
US06483147B1 Through wafer backside contact to improve SOI heat dissipation 有权
通过晶片背面接触改善SOI散热

  • Patent Title: Through wafer backside contact to improve SOI heat dissipation
  • Patent Title (中): 通过晶片背面接触改善SOI散热
  • Application No.: US09427135
    Application Date: 1999-10-25
  • Publication No.: US06483147B1
    Publication Date: 2002-11-19
  • Inventor: Ming-Ren Lin
  • Applicant: Ming-Ren Lin
  • Main IPC: H01L2701
  • IPC: H01L2701
Through wafer backside contact to improve SOI heat dissipation
Abstract:
In one embodiment, the present invention relates to a method of facilitating heat removal from a device layer of a silicon-on-insulator substrate comprising bulk silicon, an insulation layer over the bulk silicon, and a silicon device layer over the insulation layer involving forming at least one conductive plug comprising a conductive material within the bulk silicon and the insulation layer so as to contact the silicon device layer. In another embodiment, the present invention relates to a silicon-on-insulator structure, made of a silicon substrate layer; an insulation layer over the silicon substrate layer; a silicon device layer comprising silicon over the insulation layer; a conductive plug through the silicon substrate layer and the insulation layer contacting the silicon device layer; and a heat generating structure on the silicon device layer at least partially overlapping the conductive plug.
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