Invention Grant
- Patent Title: Electromagnetic wave analyzer
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Application No.: US09850772Application Date: 2001-05-08
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Publication No.: US06504612B2Publication Date: 2003-01-07
- Inventor: Rick P. Trebino
- Applicant: Rick P. Trebino
- Main IPC: G01J400
- IPC: G01J400

Abstract:
An electromagnetic wave analyzer determines intensity and phase characteristics of an electromagnetic wave such as an ultrashort laser pulse. The analyzer passes the electromagnetic wave through a Fresnel biprism that produces a probe pulse and a gated pulse. The probe pulse and the gated pulse intersect and interact in a nonlinear optical medium, such as a second harmonic generating (SHG) crystal. The nonlinear optical medium then time gates and frequency filters the electromagnetic wave producing an input pulse gated signal. A lens maps delay in a horizontal direction and crystal output angle in a vertical direction. A camera detects the output of the lens and creates a spectrogram of the electromagnetic wave.
Public/Granted literature
- US20020057435A1 Electromagnetic wave analyzer Public/Granted day:2002-05-16
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