• Patent Title: Electromagnetic wave analyzer
  • Application No.: US09850772
    Application Date: 2001-05-08
  • Publication No.: US06504612B2
    Publication Date: 2003-01-07
  • Inventor: Rick P. Trebino
  • Applicant: Rick P. Trebino
  • Main IPC: G01J400
  • IPC: G01J400
Electromagnetic wave analyzer
Abstract:
An electromagnetic wave analyzer determines intensity and phase characteristics of an electromagnetic wave such as an ultrashort laser pulse. The analyzer passes the electromagnetic wave through a Fresnel biprism that produces a probe pulse and a gated pulse. The probe pulse and the gated pulse intersect and interact in a nonlinear optical medium, such as a second harmonic generating (SHG) crystal. The nonlinear optical medium then time gates and frequency filters the electromagnetic wave producing an input pulse gated signal. A lens maps delay in a horizontal direction and crystal output angle in a vertical direction. A camera detects the output of the lens and creates a spectrogram of the electromagnetic wave.
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