发明授权
US06510085B1 Method of channel hot electron programming for short channel NOR flash arrays
有权
用于短通道NOR闪存阵列的通道热电子编程方法
- 专利标题: Method of channel hot electron programming for short channel NOR flash arrays
- 专利标题(中): 用于短通道NOR闪存阵列的通道热电子编程方法
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申请号: US09861031申请日: 2001-05-18
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公开(公告)号: US06510085B1公开(公告)日: 2003-01-21
- 发明人: Richard Fastow , Sheunghee Park , Zhigang Wang , Sameer Haddad , Chi Chang
- 申请人: Richard Fastow , Sheunghee Park , Zhigang Wang , Sameer Haddad , Chi Chang
- 主分类号: G11C1604
- IPC分类号: G11C1604
摘要:
Methods of programming and soft programming short channel NOR flash memory cells that reduce the programming currents and column leakages during both programming and soft programming while maintaining fast programming speeds. During programming, a voltage of between 7 and 10 volts is applied to the control gate, a voltage of between 4 and 6 volts; is applied to the drain, a voltage of between 0.5 and 2.0 volts is applied to the source and a voltage of between minus 2 and minus 0.5 volts is applied to the substrate of the selected cell to be programmed. During soft programming, a voltage of between 0.5 and 4.5 volts is applied to the control gates, between 4 and 5.5 volts is applied to the drains, between 0.5 and 2 volts is applied to the sources and between minus 2.0 and minus 0.5 volts is applied to the substrates of the memory cells.
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