- 专利标题: Apparatus and method of inspecting gage
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申请号: US09974346申请日: 2001-10-10
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公开(公告)号: US06510725B2公开(公告)日: 2003-01-28
- 发明人: Yuwu Zhang , Masaoki Yamagata , Yoichi Toida , Shiro Igasaki , Eiichi Tsunoda
- 申请人: Yuwu Zhang , Masaoki Yamagata , Yoichi Toida , Shiro Igasaki , Eiichi Tsunoda
- 优先权: JP2000-313894 20001013; JP2000-316319 20001017
- 主分类号: G01B2102
- IPC分类号: G01B2102
摘要:
A gage inspecting apparatus includes a jog dial 56A for controlling an amount of displacement of a measuring spindle 22 at a time when the position of the measuring spindle 22 is finely adjusted, and a shuttle ring 56B for controlling the driving direction and driving speed of the measuring spindle 22 at a time when the position of the measuring spindle 22 is roughly adjusted. The relationship between the amount of rotation of the jog dial 56A and the amount of displacement of the measuring spindle 22 can be set in correspondence with a scale interval of the gage.
公开/授权文献
- US20020046005A1 Apparatus and method of inspecting gage 公开/授权日:2002-04-18
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